An Effective Reliability Failure Acceleration Method Based on Latent Defect Modeling
نویسندگان
چکیده
Latent defect screening is important to enhance memory reliability and to reduce the manufacturing cost. This paper presents an effective reliability failure acceleration method based on defect modeling, using cell data topology for bridge defects. The experimental results show that the proposed method is very effective to screen latent defects during the wafer burn-in process due to the fail distribution of the fabrication process. Keyword: Latent defect, Reliability, Wafer Burn-In, WBI, Package Burn-In, Failure Analysis, Defect Modeling
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